Jul 7, Purchase VLSI Test Principles and Architectures - 1st Edition. Print Book & E- Book. 1st Edition. Design for Testability Bundle Print & eBook. VLSI Test Principles and Architectures: Design for Testability (The Morgan Kaufmann Series In Systems On Silicon) [Laung-Terng Wang, Cheng-Wen Wu. VLSI test principles and architectures: design for testability. Kindle eBook Instructors are also eligible for downloading PPT slide files and MSWORD.
|Language:||English, Spanish, Indonesian|
|Genre:||Politics & Laws|
|ePub File Size:||24.60 MB|
|PDF File Size:||17.33 MB|
|Distribution:||Free* [*Register to download]|
Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen. Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. VLSI Test Principles and Architectures: Design for Testability Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website. CTL Web site (ronaldweinland.info). VLSI Test Principles and Architectures, ,, ,, Laung-Terng Wang; Cheng-Wen Wu; Xiaoqing Wen, Elsevier Science - eBook Available on RedShelf. Design for Testability.
Synopsis Modern electronic testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90 nanometers or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. In order to tackle the problems associated with testing semiconductor devices, it is essential to attack them at the earliest possible design stages. This has led to the methodologies and technologies of design for testability DFT. This book is a comprehensive guide to new DFT techniques that will show the readers how to design a testability and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.